Infrared spectroscopy in the analysis, characterization, and testing of coatings

CoatingsTech

Volumn 2, Issue 18, 2005, Pages 50-59

  Chalmers, John M ^a  

^a V S Consulting   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; COATING TECHNIQUES; RADIATION; REFLECTION; SUBSTRATES;

ANGLE OF INCIDENCE; INTERNAL REFLECTION SPECTROSCOPY (IRS); REFLECTION ABSORPTION INFRARED SPECTROSCOPY (RAIRS); THIN INFRARED ABSORBING LAYERS;

INFRARED SPECTROSCOPY;

EID: 24144447067     PISSN: 24751499     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review

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