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Journal of the Physical Society of Japan

Volumn 74, Issue 7, 2005, Pages 2052-2060

Charge transfer excitation in resonant X-ray emission spectroscopy of NiO

(4) Matsubara, Masahiko a,f Uozumi, Takayuki b Kotani, Akio c,d Parlebas, Jean Claude e

a UNIVERSITY OF TOKYO (Japan)

b Osaka Prefecture University (Japan)

c RIKEN/SPring 8 ^* (Japan)

d INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

e INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG (France)

f AALTO UNIVERSITY (Finland)

Author keywords

Charge transfer energy; Impurity Anderson model; Inelastic X ray scattering; NiO; Polarization dependence; Resonant x ray emission

Indexed keywords

EID: 24144438570 PISSN: 00319015 EISSN: None Source Type: Journal
DOI: 10.1143/JPSJ.74.2052 Document Type: Article

Times cited : (47)

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