Resonant Soft X-Ray Emission Spectroscopy of NiO across the Ni L2,3 Thresholds

Journal of the Physical Society of Japan

Volumn 70, Issue 6, 2001, Pages 1813-1816

  Ishii, Hirofumi ^a   Ishiwata, Yoichi ^a   Eguchi, Ritsuko ^a   Harada, Yoshihisa ^b   Watanabe, Masamitsu ^b   Chainani, Ashish ^a,c   Shin, Shik ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^c INSTITUTE FOR PLASMA RESEARCH   (India)

Author keywords

Charge transfer excitation; d d excitation; NiO; Raman; Resonant soft X ray emission spectroscopy; Transition metal

Indexed keywords

EID: 0035626860     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.70.1813     Document Type: Article

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