Ex situ and in situ SERS analyses of polybithiophene using roughened Ag and Cu electrodes and multilayer SERS-active systems

Journal of Raman Spectroscopy

Volumn 36, Issue 8, 2005, Pages 817-823

  Bazzaoui, E A ^a   Aubard, J ^b   Felidj N ^b   Laurent, G ^b   Levi G ^b  

^a FACULTÉ DES SCIENCES   (Morocco)

^b UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

Copper electrode; Ex situ and in situ surface enhanced Raman scattering; Multilayer SERS active systems; Polybithiophene; Silver electrode

Indexed keywords

COPPER; ELECTROCHEMICAL DEPOSITION; ELECTROCHEMICAL ELECTRODES; ELECTROPOLYMERIZATION; IRON; MULTILAYER FILMS; MULTILAYERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REDUCTION; SEMICONDUCTING FILMS; SEMICONDUCTOR DOPING; SILVER; SURFACE SCATTERING;

ACTIVE SYSTEMS; COPPER ELECTRODES; ENHANCED RAMAN SCATTERING; EX SITU; EX SITU AND IN SITU SURFACE-ENHANCED RAMAN SCATTERING; MULTILAYER SURFACE-ENHANCED RAMAN SCATTERING-ACTIVE SYSTEM; MULTILAYER SURFACES; POLY-BITHIOPHENE; SILVER ELECTRODE; SURFACE ENHANCED RAMAN;

POLYMER FILMS;

EID: 24044483854     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1368     Document Type: Article

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