SERS spectra of polyaniline thin films deposited on rough Ag, Au and Cu. Polymer film thickness and roughness parameter dependence of SERS spectra

Synthetic Metals

Volumn 96, Issue 1, 1998, Pages 63-70

  Baibarac, M ^a   Cochet, M ^b   Lapkowski M ^c   Mihut, L ^a   Lefrant, S ^b   Baltog, I ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^c SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Polyaniline; Roughness; Surface enhanced Raman scattering

Indexed keywords

AROMATIC POLYMERS; CHARGE TRANSFER; CONDUCTIVE FILMS; COPPER; DEPOSITION; ELECTRON TRANSPORT PROPERTIES; GOLD; INTERFACES (MATERIALS); RAMAN SPECTROSCOPY; SILVER; SURFACE ROUGHNESS; THIN FILMS;

POLYANILINE; SURFACE-ENHANCED RAMAN SCATTERING (SERS);

CONDUCTIVE PLASTICS;

EID: 0032108416     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(98)00065-4     Document Type: Article

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