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Volumn 2, Issue 3, 2005, Pages 1233-1238

X-ray characterization of CdO thin films grown on a-, c-, r- And m-plane sapphire by metalorganic vapour phase-epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; CRYSTAL ORIENTATION; METALLORGANIC VAPOR PHASE EPITAXY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

EID: 24044469781     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200460672     Document Type: Conference Paper
Times cited : (17)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.