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Volumn 79, Issue 1-2, 2005, Pages 91-100

Variance reduction in estimating classification error using sparse datasets

Author keywords

Bootstrap resampling; Crossvalidation; Error rate estimation; Small sample size

Indexed keywords

ANALYSIS OF VARIANCE; ANALYTICAL ERROR; ARTICLE; CLASSIFICATION; DATA BASE; LINEAR SYSTEM; NONLINEAR SYSTEM; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; VALIDATION PROCESS;

EID: 24044448496     PISSN: 01697439     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemolab.2005.04.008     Document Type: Article
Times cited : (56)

References (21)
  • 7
    • 85164392958 scopus 로고
    • C.S. Mellish Proceedings. 14th International Joint Conference, 20-25 August 1995, Montréal, Québec, Canada Morgan Kaufmann USA
    • R. Kohavi C.S. Mellish Artificial Intelligence Proceedings. 14th International Joint Conference, 20-25 August 1995, Montréal, Québec, Canada 1995 Morgan Kaufmann USA 1137 1145
    • (1995) Artificial Intelligence , pp. 1137-1145
    • Kohavi, R.1
  • 9
    • 0347458021 scopus 로고    scopus 로고
    • A. Sanfeliu J.J. Villanueva M. Vanrell R. Alquézar A.K. Jain J. Kittler Proceedings. 15th International Conference on, Vol. II, 3-7 September 2000, Barcelona, Spain IEEE Computer Society USA
    • H. Schulerud A. Sanfeliu J.J. Villanueva M. Vanrell R. Alquézar A.K. Jain J. Kittler Pattern Recognition Proceedings. 15th International Conference on, Vol. II, 3-7 September 2000, Barcelona, Spain 2000 IEEE Computer Society USA 372 377
    • (2000) Pattern Recognition , pp. 372-377
    • Schulerud, H.1
  • 10
    • 0029542206 scopus 로고
    • Proceedings of the International Conference, vol. I, 27 Nov.-1 Dec. 1995, Perth, WA, Australia IEEE USA
    • N. Ueda, and R. Nakano Neural Networks Proceedings of the International Conference, vol. I, 27 Nov.-1 Dec. 1995, Perth, WA, Australia 1995 IEEE USA 101 104
    • (1995) Neural Networks , pp. 101-104
    • Ueda, N.1    Nakano, R.2
  • 17
    • 0025545069 scopus 로고
    • Proceedings. 10th International Conference on, vol. I, Atlantic City, New Jersey, USA, 16-21 June IEEE USA
    • S.J. Raudys, and A.K. Jain Pattern Recognition Proceedings. 10th International Conference on, vol. I, Atlantic City, New Jersey, USA, 16-21 June 1990 IEEE USA 417 423
    • (1990) Pattern Recognition , pp. 417-423
    • Raudys, S.J.1    Jain, A.K.2
  • 19
    • 0003408496 scopus 로고    scopus 로고
    • Irvine, CA, University of California, Department of Information and Computer Science
    • C.L. Blake, C.J. Merz, UCI Repository of machine learning databases [http://www.ics.uci.edu/∼mlearn/MLRepository.html]. Irvine, CA, University of California, Department of Information and Computer Science, (1998).
    • (1998) UCI Repository of Machine Learning Databases
    • Blake, C.L.1    Merz, C.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.