Electron backscattered diffraction analyses combined with environmental scanning electron microscopy: Potential applications for non-conducting, uncoated mineralogical samples

Materials Science and Technology

Volumn 16, Issue 11-12, 2000, Pages 1393-1398

  Habesch, S M ^a  

^a SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24044442985     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708300101507343     Document Type: Article

References (3)

1. v. RaNDLE: 'Microtexture determination and its applications', 174; 1992, London, The Institute of Materials.
2. F. j. HUMPHREYS: J. Microsc., 1999, 195, 170-185.
3. G. E. LLOYD: Mineral. Mag., 1987, 5T, 3-19.