Determination of trace elements in sediment reference materials by monochromatic X-ray excitation X-ray fluorescence spectrometry

Analytical Sciences

Volumn 21, Issue 7, 2005, Pages 827-832

  Kurahashi, Masayasu ^a   Mizutani, Jun ^a   Hioki, Akiharu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; SPECTROMETRY; TRACE ELEMENTS; UNCERTAINTY ANALYSIS;

FUNDAMENTAL PARAMETER METHOD; MASS ATTENUATION COEFFICIENTS; MONOCHROMATIC X-RAYS; REFERENCE MATERIAL; SEDIMENT CERTIFIED REFERENCE MATERIALS; X RAY FLUORESCENCE; X RAY FLUORESCENCE SPECTROMETRY; X-RAY WAVELENGTHS;

X RAYS;

EID: 23944515812     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.21.827     Document Type: Article

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