Certified sediment reference materials for trace element analysis from the National Metrology Institute of Japan (NMIJ)

Analytical and Bioanalytical Chemistry

Volumn 378, Issue 5, 2004, Pages 1271-1276

  Inagaki, Kazumi ^a   Takatsu, Akiko ^a   Kuroiwa, Takayoshi ^a   Nakama, Atsuko ^a   Eyama, Sakae ^a   Chiba, Koichi ^a   Okamoto, Kensaku ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Certification; Certified reference material; Isotope dilution; Sediment; Trace elements

Indexed keywords

ABSORPTION; EVAPORATION; INDUCTIVELY COUPLED PLASMA; IRRADIATION; ISOTOPES; MASS SPECTROMETRY; MICROWAVES; SEDIMENTS; SOCIETIES AND INSTITUTIONS; TRACE ELEMENTS;

ATOMIC EMISSION SPECTROMETRY; CERTIFICATION; CERTIFIED REFERENCE MATERIALS (CRM); ISOTOPE DILUTION;

MATERIALS SCIENCE;

TRACE ELEMENT;

ARTICLE; CERTIFICATION; CHEMISTRY; GOVERNMENT; JAPAN; SEDIMENT; STANDARD;

CERTIFICATION; GEOLOGIC SEDIMENTS; GOVERNMENT AGENCIES; JAPAN; REFERENCE STANDARDS; TRACE ELEMENTS;

EID: 13844278689     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-003-2327-x     Document Type: Conference Paper

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12. Inagaki K, Takatsu A, Nakama A, Yabutani Y, Chiba K, Okamoto K (2003) Abstract of the European Winter Conference on Plasma Spectrochemistry, Garmisch-Partenkirchen, Germany: 192