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Analytical Sciences

Volumn 21, Issue 7, 2005, Pages 869-872

Test method for the presence or absence of Pb in electrical components using energy-dispersive micro X-ray fluorescence

(4) Araki, Wakako a Mizoroki, Kaoru a Oki, Mitsuhiro a Takenaka, Miyuki a

a TOSHIBA CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COPPER ALLOYS; COPPER METALLOGRAPHY; ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LEAD-FREE SOLDERS; MICROMETERS; QUALITY CONTROL; RELIABILITY ANALYSIS; SCANNING ELECTRON MICROSCOPY; SCREENING; SILVER ALLOYS; SILVER METALLOGRAPHY; TERNARY ALLOYS; TESTING; THIN FILMS; TIN ALLOYS; TIN METALLOGRAPHY; X RAYS;

CALCULATION PARAMETERS; ELECTRICAL COMPONENTS; ENERGY DISPERSIVE; ENERGY DISPERSIVE X-RAY FLUORESCENCE; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRIES (ICPMS); MICRO X-RAY FLUORESCENCE; SCREENING METHODS; TESTING RELIABILITY;

LEAD METALLOGRAPHY;

EID: 23944497612 PISSN: 09106340 EISSN: 13482246 Source Type: Journal
DOI: 10.2116/analsci.21.869 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.