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Volumn 44, Issue 6 A, 2005, Pages 4187-4188
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Quality of anthracene single crystals obtained by physical vapor growth
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Author keywords
Anthracene; Atomic force microscopy; Physical vapor growth; Quality; Single crystal; X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL GROWTH;
MONOLAYERS;
PHYSICAL VAPOR DEPOSITION;
X RAY DIFFRACTION ANALYSIS;
ANTHRACENE;
PHYSICAL VAPOR GROWTH;
QUALITY;
SINGLE CRYSTALS;
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EID: 23944470345
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.44.4187 Document Type: Article |
Times cited : (12)
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References (16)
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