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Volumn 44, Issue 6 A, 2005, Pages 4187-4188

Quality of anthracene single crystals obtained by physical vapor growth

Author keywords

Anthracene; Atomic force microscopy; Physical vapor growth; Quality; Single crystal; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; MONOLAYERS; PHYSICAL VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

EID: 23944470345     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.4187     Document Type: Article
Times cited : (12)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.