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16
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33645407083
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note
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3 520.1353.
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17
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0001006533
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(a) Kurland, R. J.; Rubin, M. B.; Wise, W. B. J. Chem. Phys. 1964, 40, 2426-2427.
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19
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33645385306
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-
note
-
2, 96), 279 (100).
-
-
-
-
20
-
-
33645398486
-
-
note
-
2) = 0.1408, and S = 1.026 for 5085 unique reflections and 260 parameters.
-
-
-
-
22
-
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0004150157
-
-
Siemens Analytical X-ray Instruments: Madison, WI
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(b) Sheldrick, G. M. SHELXTL, version 5; Siemens Analytical X-ray Instruments: Madison, WI, 1996.
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(1996)
SHELXTL, Version 5
-
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Sheldrick, G.M.1
-
24
-
-
33645410876
-
-
note
-
Calculations were performed by using GAUSSIAN 98; the built-in default thresholds for wave function and gradient convergence were employed.
-
-
-
-
26
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11644328584
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Allen, F. H.; Kennard, O.; Taylor, R. Acc. Chem. Kes. 1983, 16, 146-153.
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Allen, F.H.1
Kennard, O.2
Taylor, R.3
-
27
-
-
33645379827
-
-
note
-
Only nonionic, nonorganometallic structures are included in this average.
-
-
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