Public-opened internet electron microscopy 2005 in Japan - Remote-control SEM and TEM for high-school users

Microscopy and Microanalysis

Volumn 11, Issue SUPPL. 2, 2005, Pages 68-69

  Furuya, K ^a   Tanaka, M ^a   Mitsuishi, K ^a   Ishikawa, N ^a   Tameike, A ^a   Date, M ^b   Yamada, A ^b   Okura, Y ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23844533019     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760550504X     Document Type: Conference Paper

References (3)

1. N. J Zaluzec , Teleconference Mag., 17 (1998)
2. N. Yamada et al., Society of Neuroscience, 25 (1999)
3. K. Yoshida et al., J.Electron Microsc., 48 (1999) 865