Two-dimensional microstrip germanium detector for X-Ray spectroscopy of highly charged heavy ions

IEEE Nuclear Science Symposium Conference Record

Volumn 2, Issue , 2004, Pages 941-942

  Protic D ^a   Stöhlker, Th ^b   Krings, T ^a   Mohos, I ^a   Spillmann, U ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC POTENTIAL; GERMANIUM; HEAVY IONS; PHOTONS; PLASMA ETCHING; X RAY SPECTROSCOPY; X RAYS;

ATOMIC TRANSITIONS; ENERGY RESOLUTION; MICROSTRIP GERMANIUM DETECTORS; TEMPERATURE TESTING;

RADIATION DETECTORS;

EID: 23844527830     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. D. Protić and T. Krings, "Detection characteristics of Ge detectors with microstructured amorphous Ge contacts", in Proc. IEEE Conf. Nuclear Science Symp., Portland, OR, 2003.
2. D. Protić and T. Krings, "Microstructures on Ge detectors with amorphous Ge contacts", IEEE Trans. Nucl. Sci., vol. 50, pp. 998-1000, August 2003.
3. G. Riepe and D. Protić, "Thick silicon strip detectors", Nucl. Instrum. Methods, vol. 226, pp. 103-106, 1984.
4. D. Protić and G. Riepe, "Position-sensitive germanium detectors", IEEE Trans. Nucl. Sci., vol. NS-32, pp. 553-555. February 1985.
5. D. Protić, Th. Stöhlker, H. F. Beyer, J. Bojowald, G. Borchert, A. Hamacher, et al., "A micro-strip germanium detector for position sensitive X-ray spectroscopy", IEEE Trans. Nucl. Sci., vol. 48, pp. 1048-1052, August 2001.
6. Th. Stöhlker, D. Banas, H. F. Beyer, A. Gumberidze, C. Kozhuharov, E. Kanter, et al., "Applications of position sensitive germanium detectors for X-ray spectroscopy of highly charged heavy ions", Nucl. Instrum. Methods B, vol. 205, pp. 210-214, 2003.