Detection characteristics of Ge detectors with microstructured amorphous Ge contacts

IEEE Nuclear Science Symposium Conference Record

Volumn 1, Issue , 2003, Pages 571-575

  Protic D ^a   Krings, T ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; MICROSTRUCTURE; PHOTOLITHOGRAPHY; PHOTONS; PLASMA ETCHING;

ENERGY RESOLUTION; GERMANIUM DETECTORS; GROOVES;

GERMANIUM;

EID: 11844249442     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nssmic.2003.1352107     Document Type: Conference Paper

References (12)

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10. M. Amman, private communication.
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