-
4
-
-
10444271014
-
-
M.I. Khan, E. Yohannes, R. Nome, S. Ayesh, R.J. Doedens, V.O. Golub, and C.J. O'Connor Chem. Mater. 16 2004 5273
-
(2004)
Chem. Mater.
, vol.16
, pp. 5273
-
-
Khan, M.I.1
Yohannes, E.2
Nome, R.3
Ayesh, S.4
Doedens, R.J.5
Golub, V.O.6
O'Connor, C.J.7
-
5
-
-
6344228304
-
-
M.I. Khan, S. Deb, V.O. Golub, C.J. O'Connor, and R.J. Doedens J. Mol. Str. 707 2004 217
-
(2004)
J. Mol. Str.
, vol.707
, pp. 217
-
-
Khan, M.I.1
Deb, S.2
Golub, V.O.3
O'Connor, C.J.4
Doedens, R.J.5
-
10
-
-
0002564811
-
-
M.I. Khan, S. Cevik, D. Powell, S. Li, and C.J. O'Connor Inorg. Chem. 37 1998 81
-
(1998)
Inorg. Chem.
, vol.37
, pp. 81
-
-
Khan, M.I.1
Cevik, S.2
Powell, D.3
Li, S.4
O'Connor, C.J.5
-
13
-
-
0347991607
-
-
M.I. Khan, S. Tabussum, R.J. Doedens, V.O. Golub, and C.J. O'Connor Inorg. Chem. Commun. 7 2004 54
-
(2004)
Inorg. Chem. Commun.
, vol.7
, pp. 54
-
-
Khan, M.I.1
Tabussum, S.2
Doedens, R.J.3
Golub, V.O.4
O'Connor, C.J.5
-
14
-
-
0041526042
-
-
M.I. Khan, T. Hope, S. Cevik, C. Zheng, and D. Powell J. Cluster Sci. 11 2000 433
-
(2000)
J. Cluster Sci.
, vol.11
, pp. 433
-
-
Khan, M.I.1
Hope, T.2
Cevik, S.3
Zheng, C.4
Powell, D.5
-
17
-
-
23844534525
-
-
note
-
2O in the 2-300 K temperature range using a Quantum Design MPMS-5S SQUID spectrometer. The calibrating and operating procedures were done according to the literature method [11]. Temperature dependent magnetic data were obtained at a magnetic field H = 1000 Oe.
-
-
-
-
19
-
-
0003560660
-
-
Simens Analytical X-Ray Systems, Madison, WI
-
SMART, Version 4.210, Simens Analytical X-Ray Systems, Madison, WI, 1997.
-
(1997)
SMART, Version 4.210
-
-
-
20
-
-
0003933522
-
-
Simens Analytical X-Ray Systems, Madison, WI
-
SAINT, Version 4.050, Simens Analytical X-Ray Systems, Madison, WI, 1995.
-
(1995)
SAINT, Version 4.050
-
-
-
21
-
-
0004283944
-
-
University of Gottingen Gottingen, Germany
-
G.M. Sheldrick SADABS 1997 University of Gottingen Gottingen, Germany
-
(1997)
SADABS
-
-
Sheldrick, G.M.1
-
22
-
-
0004150157
-
-
Siemens Industrial Automation Inc. Madison, WI
-
G.M. Sheldrick SHELXTEL Version 5.1 1995 Siemens Industrial Automation Inc. Madison, WI
-
(1995)
SHELXTEL Version 5.1
-
-
Sheldrick, G.M.1
-
23
-
-
23844491946
-
-
2 is 1.064. Further details of the structure determination are available on request from the Cambridge Crystallographic Data Center, 12 Union Road, Cambridge CB2 1EZ, UK (e-mail: deposit@ccdc.cam.ac.uk) by quoting the depository number CCDC 270164 (http://www.ccdc.cam.ac.uk ).
-
-
-
-
25
-
-
23844441310
-
-
note
-
-1 due to N-H wagging of the ligand either disappear or are shifted to the lower frequencies and overlap with the V-O-V stretching of the polyoxovanadate fragment.
-
-
-
-
30
-
-
0039429103
-
-
A.S.J. Wery, J.M.G. Zorrilla, A. Luque, M. Ugalde, and P. Roman Chem. Mater. 8 1996 408
-
(1996)
Chem. Mater.
, vol.8
, pp. 408
-
-
Wery, A.S.J.1
Zorrilla, J.M.G.2
Luque, A.3
Ugalde, M.4
Roman, P.5
|