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Volumn 26, Issue 8, 2005, Pages 533-534

A high-power W-band pseudomorphic InGaAs channel PHEMT

Author keywords

Compound semiconductor; High electron mobility transistors (HEMTs); InGaAs; Microwave; Power; Pseudomorphic; W band

Indexed keywords

CURRENT DENSITY; ELECTRIC BREAKDOWN; EPITAXIAL GROWTH; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SUBSTRATES;

EID: 23844513731     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2005.852520     Document Type: Article
Times cited : (17)

References (7)
  • 4
    • 0345148446 scopus 로고    scopus 로고
    • "Influence on power performances at 60 GHz of Indium composition in methamorphic HEMTs"
    • C. Gaquiere, S. Bollaert, M. Zaknoune, Y. Cordier, D. Theron, and Y. Crosnier, "Influence on power performances at 60 GHz of Indium composition in methamorphic HEMTs," Electron. Lett., vol. 35, no. 17, pp. 1489-1490, 1999.
    • (1999) Electron. Lett. , vol.35 , Issue.17 , pp. 1489-1490
    • Gaquiere, C.1    Bollaert, S.2    Zaknoune, M.3    Cordier, Y.4    Theron, D.5    Crosnier, Y.6
  • 7
    • 0033525336 scopus 로고    scopus 로고
    • "Pulsed bias/pulsed RF characterization measurements system of FET at constant intrinsic voltages"
    • C. Gaquiere, J. P. Lafont, and Y. Crosnier, "Pulsed bias/pulsed RF characterization measurements system of FET at constant intrinsic voltages," IEE Microw. Opt. Technol. Lett., vol. 20, no. 5, pp. 349-352, 1999.
    • (1999) IEE Microw. Opt. Technol. Lett. , vol.20 , Issue.5 , pp. 349-352
    • Gaquiere, C.1    Lafont, J.P.2    Crosnier, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.