|
Volumn 28, Issue 4, 2005, Pages 345-348
|
Recent developments in analytical techniques for characterization of ultra pure materials - An overview
|
Author keywords
GD MS; High purity tellurium (7N); HR ICP MS; ICP MS; Trace metal impurities; Ultrapure materials
|
Indexed keywords
DECOMPOSITION;
EVAPORATION;
FLUORESCENCE;
IMPURITIES;
INDUCTIVELY COUPLED PLASMA;
MASS SPECTROMETRY;
SOLUTIONS;
TELLURIUM;
X RAY ANALYSIS;
GD-MS;
HIGH PURITY TELLURIUM (7N);
HR-ICP-MS;
ICP-MS;
TRACE METAL IMPURITIES;
ULTRAPURE MATERIALS;
PURIFICATION;
|
EID: 23844493783
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02704247 Document Type: Conference Paper |
Times cited : (14)
|
References (12)
|