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Volumn 28, Issue 4, 2005, Pages 345-348

Recent developments in analytical techniques for characterization of ultra pure materials - An overview

Author keywords

GD MS; High purity tellurium (7N); HR ICP MS; ICP MS; Trace metal impurities; Ultrapure materials

Indexed keywords

DECOMPOSITION; EVAPORATION; FLUORESCENCE; IMPURITIES; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; SOLUTIONS; TELLURIUM; X RAY ANALYSIS;

EID: 23844493783     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02704247     Document Type: Conference Paper
Times cited : (14)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.