Fracture mechanisms of GaAs under nanoscratching

Materials Research Society Symposium Proceedings

Volumn 841, Issue , 2005, Pages 259-264

  Solletti, J M ^a   Parlinska Wojtan, M ^a   Tharian, J ^b   Wasmer, K ^b   Michler, J ^b   Ballif, C ^c   Schulz, D ^d   Karimi, A ^a  

^a EPFL   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^d Bookham Technologies Plc   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED ION BEAMS (FIB); MATERIAL PROPERTIES; NANOSCRATCHING; TENSILE CRACKS;

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; CRACKS; FRACTURE MECHANICS; ION BEAMS; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VELOCITY MEASUREMENT;

GALLIUM COMPOUNDS;

EID: 23844493423     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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