An implanted diode X-ray detector in silicon optical elements

IEEE Nuclear Science Symposium Conference Record

Volumn 7, Issue , 2004, Pages 4695-4698

  Hall, C ^a   Dobson, B ^a   Groves, J ^a   Salvini, G ^a   Lewis, R ^b  

^a DARESBURY LABORATORY   (United Kingdom)

^b MONASH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; IONIZATION; MEDICAL IMAGING; MONOCHROMATORS; OPTICAL DEVICES; PHOTODIODES; SILICON WAFERS; X RAY APPARATUS; X RAYS;

PHOTO IONIZATION; PITCH ANGLES; SILICON OPTICAL ELEMENTS; X-RAY DETECTORS;

DIODES;

EID: 23844474434     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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5. T. J. Davis, D. Gao, T. E. Gureyev, A. W. Stevenson and S. W. Wilkins "Phase-Contrast Imaging of Weakly Absorbing Materials Using Hard X-Rays." Nature 373 (1995) 595-598.
6. D. Chapman, W. Thomlinson, R. E Johnston, D. Washburn, E. Pisano, N. Gmur, Z. Zhong, R.Menk, F. Arfelli, D. Sayers, "Diffraction enhanced x-ray imaging." Physics in Medicine and Biology Phys. Med. Biol. 42 (1997) 2015-2025.