External reflection fourier transform infrared spectroscopy of surfactants at the air-water interface: Separation of bulk and adsorbed surfactant signals

Applied Spectroscopy

Volumn 59, Issue 8, 2005, Pages 993-1001

  Campbell, Richard A ^a   Day, James P R ^a   Bain, Colin D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Air water interface; APFN; ATR; Attenuated total reflection; Dynamic surface excess; External reflection FT IR spectroscopy; Overflowing cylinder; Surfactant adsorption; Target factor analysis; TFA

Indexed keywords

ADSORBENTS; ADSORPTION; CURVE FITTING; FLUOROCARBONS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); SEPARATION; THIN FILMS;

AIR-WATER INTERFACE; APFN; ATTENUATED TOTAL REFLECTION; DYNAMIC SURFACE EXCESS; EXTERNAL REFLECTION FT-IR SPECTROSCOPY; OVERFLOWING CYLINDER; SURFACTANT ADSORPTION; TARGET FACTOR ANALYSIS (TFA);

SURFACE ACTIVE AGENTS;

EID: 23844460563     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702054615241     Document Type: Article

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