Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- And 6H-SiC seeds

Materials Research Society Symposium Proceedings

Volumn 831, Issue , 2005, Pages 447-452

  Raghothamachar, Balaji ^a   Dudley, Michael ^a   Dalmau, Rafael ^b   Schlesser, Raoul ^b   Sitar, Zlatko ^b  

^a STONY BROOK UNIVERSITY   (United States)

^b North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; FIELD EFFECT TRANSISTORS; GROWTH KINETICS; HYDROGEN; LIGHT EMITTING DIODES; OPTICAL RESOLVING POWER; SEMICONDUCTOR LASERS; SILICON CARBIDE; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

GROWTH PROCESSES; LATTICE PLANES; RESIDUAL STRAIN; SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY (SWBXT);

ALUMINUM NITRIDE;

EID: 23844438886     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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