Monitoring Infrequent Failures of High-volume Production Processes

Quality and Reliability Engineering International

Volumn 21, Issue 5, 2005, Pages 521-528

  Di Bucchianico, A ^a   Mooiweer, G D ^a,b,c   Moonen, E J G ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Limited   (Netherlands)

^c Math and Computer Science Dept

Author keywords

Attribute data; Average length of inspection; CCC r chart; Control chart; High yield; Standard deviation of length of inspection

Indexed keywords

ATTRIBUTE DATA; AVERAGE LENGTH OF INSPECTION; CCCR-CHART; CONTROL CHART; HIGH YIELD; STANDARD DEVIATION OF LENGTH OF INSPECTION;

LEAK DETECTION; NORMAL DISTRIBUTION; PARAMETER ESTIMATION; PROBABILITY; PROCESS CONTROL; PROCESS ENGINEERING; STATISTICAL METHODS;

QUALITY ASSURANCE;

EID: 23744499925     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.738     Document Type: Review

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