Cumulative probability control charts for geometric and exponential process characteristics

International Journal of Production Research

Volumn 40, Issue 1, 2002, Pages 133-150

  Chan, L Y ^a   Lin, Dennis K J ^b   Xie, M ^c   Goh, T N ^c  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; POISSON DISTRIBUTION; PROBABILITY; PROCESS ENGINEERING; PRODUCTION ENGINEERING;

CUMULATIVE COUNT CONTROL CHART; CUMULATIVE PROBABILITY CONTROL CHARTS; CUMULATIVE QUANTITY CONTROL CHART; PRODUCTION PROCESSES;

STATISTICAL PROCESS CONTROL;

EID: 0037050383     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540110073073     Document Type: Article

References (16)

1. Performance of sensitizing rules on Shewhart control charts with autocorrelated data
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4. Two-stage control charts for high yield processes
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6. A control chart for very high yield processes
7. The Shewhart control chart-test for special causes
8. Interpreting Shewhart X̄ control charts
9. Some procedures for decision making in controlling high yield processes
10. A quality monitoring and decision-making scheme for automated production processes
11. A Shewhart-like charting techniques for high yield processes
12. The box-chart: A new variable control chart for univariate and multivariate processes