Layer-by-layer J-aggregate thin films with a peak absorption constant of 106 cm-1

Advanced Materials

Volumn 17, Issue 15, 2005, Pages 1881-1886

  Bradley, M Scott ^a   Tischler, Jonathan R ^a   Bulović, Vladimir ^a  

^a Department of Electrical Engineering and Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; GLASS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; OPTOELECTRONIC DEVICES;

LAYER-BY-LAYER (LBL) METHOD; LAYERED GROWTH; OPTICAL CONSTANTS; TRANSMITTANCE MEASUREMENT;

THIN FILMS;

EID: 23644443372     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200500233     Document Type: Article

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