Ultraviolet light treatment of thin high-density polyethylene films monitored with a quartz crystal microbalance

Journal of Applied Polymer Science

Volumn 92, Issue 5, 2004, Pages 2833-2839

  Øiseth, Sofia Kihlman ^a   Krozer, Anatol ^b   Lausmaa, Jukka ^c   Kasemo, Bengt ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b Imego AB The Institute of Micro and Nanotechnology   (Sweden)

^c SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; ARGON; ATOMIC FORCE MICROSCOPY; DEGRADATION; HYDROGEN BONDS; OPTICAL MICROSCOPY; OZONE; PERTURBATION TECHNIQUES; QUARTZ; SURFACE PROPERTIES; THIN FILMS; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC OXYGEN (AO); PHOTOCROSSLINKING; QUARTZ CRYSTAL MICROBALANCE (QCM); ULTRAVIOLET ABSORPTION;

HIGH DENSITY POLYETHYLENES;

POLYMER SCIENCE;

EID: 2342648052     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.20140     Document Type: Article

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