HRTEM characterization of YBa2Cu3O 7-δ thick films on LaAlO3 substrates

Physica C: Superconductivity and its Applications

Volumn 405, Issue 2, 2004, Pages 127-132

  Zeng, Jianming ^a   Lian, Jie ^b   Wang, Luming ^b   Chou, Penchu ^a   Ignatiev, Alex ^a  

^a UNIVERSITY OF HOUSTON   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; GRAIN BOUNDARIES; LANTHANUM COMPOUNDS; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

COATED CONDUCTORS; INTERFACE MICROSTRUCTURES; SURFACE MICROSTRUCTURES;

THICK FILMS;

EID: 2342642083     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.02.002     Document Type: Article

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