Direct observation of domain wall scattering in patterned Ni 80Fe20 and Ni nanowires by current-voltage measurements

Physical Review Letters

Volumn 92, Issue 12, 2004, Pages

  Lepadatu, S ^a   Xu, Y B ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTALS; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRON BEAM LITHOGRAPHY; ELECTRONS; FERROMAGNETIC MATERIALS; IMPURITIES; MAGNETORESISTANCE; THERMAL EFFECTS; ULTRASONICS; WIRE;

BALLISTIC MAGNETORESISTANCE; DOMAIN WALL RESISTIVITY; FERROMAGNETIC WIRES; NANOCONSTRICTIONS;

NICKEL COMPOUNDS;

EID: 2342625163     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.127201     Document Type: Article

References (22)

1. M. Kläui et al., Phys. Rev. Lett. 90, 097202 (2003).
2. J. L. Prieto, M. G. Blamire, and J. E. Evetts, Phys. Rev. Lett. 90, 027201 (2003).
3. Y. B. Xu et al., Phys. Rev. B 61, 14901 (2000).
4. J. L. Tsai et al., J. Appl. Phys. 91, 7983 (2002).
5. M. Viret et al., Phys. Rev. B 53, 8464 (1996).
6. U. Ebels et al., Phys. Rev. Lett. 84, 983 (2000).
7. J. F. Gregg et al., Phys. Rev. Lett. 77, 1580 (1996).
8. P.M. Levy and S. Zhang, Phys. Rev. Lett. 79, 5110 (1997).
9. G. Tatara and H. Fukuyama, Phys. Rev. Lett. 78, 3773 (1997).
10. J. J. Versluijs, M. Bari, and J. M. D. Coey, Phys. Rev. Lett. 87, 026601 (2001).
11. N. García, M. Muñoz, and Y.W. Zhao, Phys. Rev. Lett. 82, 2923 (1999).
12. S.H. Chung et al., Phys. Rev. Lett. 89, 287203 (2002).
13. G. Tatara, Y.W. Zhao, M. Muñoz, and N. Garcia, Phys. Rev. Lett. 83, 2030 (1999).
14. J. Grollier et al., J. Appl. Phys. 92, 4825 (2002); J. Grollier et al., Appl. Phys. Lett. 83, 509 (2003).
15. J. Grollier et al., J. Appl. Phys. 92, 4825 (2002); J. Grollier et al., Appl. Phys. Lett. 83, 509 (2003).
16. L. Berger, J. Appl. Phys. 55, 1954 (1984).
17. P. P. Freitas and L. Berger, J. Appl. Phys. 57, 1266 (1985); C. Y. Hung and L. Berger, J. Appl. Phys. 63, 4276 (1988).
18. P. P. Freitas and L. Berger, J. Appl. Phys. 57, 1266 (1985); C. Y. Hung and L. Berger, J. Appl. Phys. 63, 4276 (1988).
19. S. Methfessel, S. Middelhoek, and H. Thomas, IBM J. Res. Dev. 4, 96 (1960).
20. H. Sato et al., Phys. Rev. B 61, 3227 (2000).
21. T. Tanyiama, I. Nakatani, T. Namikawa, and Y. Yamazaki, Phys. Rev. Lett. 82, 2780 (1999).
22. U. Ruediger et al., Phys. Rev. Lett. 80, 5639 (1998).