Universal Scaling of Ballistic Magnetoresistance in Magnetic Nanocontacts

Physical Review Letters

Volumn 89, Issue 28, 2002, Pages

  Chung, S H ^a   Munoz M ^b   Garcia N ^b   Egelhoff, W F ^c   Gomez, R D ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b CSIC   (Spain)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; COERCIVE FORCE; ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY; FERROMAGNETIC MATERIALS; HETEROJUNCTIONS; MAGNETIC FIELDS; METAL INSULATOR TRANSITION; METALLIC FILMS; NANOSTRUCTURED MATERIALS; NICKEL; POLYCRYSTALLINE MATERIALS;

BALLISTIC MAGNETORESISTANCE; MAGNETIC DOMAIN WALL; MAGNETIC NANOCONTACTS; MAGNETOCONDUCTANCE; SPIN SCATTERING;

MAGNETORESISTANCE;

EID: 0037207348     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.287203     Document Type: Article

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