Statistical characterization of morphological features of layer-by-layer polymer films by image analysis

Journal of Nanoscience and Nanotechnology

Volumn 3, Issue 3, 2003, Pages 257-261

  Costa, Luciano Da F ^a   Rodrigues, Carlos A ^a   De Souza, Nara C ^a   Oliveira Jr , Osvaldo N ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Atomic Force Microscopy; Granulometry; Image Analysis; Polymer Films

Indexed keywords

POLYMER;

ANALYTIC METHOD; ARTICLE; CHEMICAL PARAMETERS; CHEMICAL PROCEDURES; CHEMICAL REACTION; FILM; IMAGE ANALYSIS; MORPHOLOGY; PARTICLE SIZE; PARTITION COEFFICIENT; STATISTICAL ANALYSIS; ATOMIC FORCE MICROSCOPY; CHEMISTRY; IMAGE PROCESSING; METHODOLOGY; NANOTECHNOLOGY;

IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; PARTICLE SIZE; POLYMERS;

EID: 2342619535     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2003.197     Document Type: Article

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