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Volumn 84, Issue 15, 2004, Pages 2796-2798

Directed nanostructural evolution in Ti 0.8Ce 0.2N layers grown as a function of low-energy, high-flux ion irradiation

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY (AFM); DEPOSITION FLUX; ION IRRADIATION; RENUCLEATION PROCESSES;

EID: 2342612929     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1699468     Document Type: Article
Times cited : (10)

References (26)
  • 2
    • 0033438070 scopus 로고    scopus 로고
    • S. Vepřek, J. Vac. Sci. Technol. A 17, 2401 (1999); T. Zehnder and J. Patscheider, Surf. Coat. Technol. 133, 138 (2000).
    • (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 2401
    • Vepřek, S.1
  • 8
    • 0000978538 scopus 로고    scopus 로고
    • L. Hultman, G. Hakånsson, U. Wahlström, J.-E. Sundgren, I. Petrov, F. Adibi, and J. E. Greene, Thin Solid Films 205, 153 (1991); J.-S. Chun, I. Petrov, and J. E. Greene, J. Appl. Phys. 86, 3633 (1999).
    • (1999) J. Appl. Phys. , vol.86 , pp. 3633
    • Chun, J.-S.1    Petrov, I.2    Greene, J.E.3
  • 23
    • 0003818605 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Pennsylvania: Card number 38-1420
    • Inorganic Index to Powder Diffraction File (Joint Committee on Powder Diffraction Standards, Pennsylvania, 1997): Card number 38-1420.
    • (1997) Inorganic Index to Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.