|
Volumn 524, Issue 1-3, 2004, Pages 236-244
|
The spatial and energy response of a 3d architecture silicon detector measured with a synchrotron X-ray microbeam
|
Author keywords
3D; Detector; Silicon; X ray
|
Indexed keywords
AMPLIFIERS (ELECTRONIC);
CHARGE CARRIERS;
CRYSTALLOGRAPHY;
ELECTRODES;
POLYSILICON;
SAMPLING;
SILICON WAFERS;
SYNCHROTRON RADIATION;
X RAYS;
3D;
CHARGE SPLITTING;
PIXEL CELLS;
SPATIAL RESPONSE;
X RAY MICROBEAMS;
SEMICONDUCTOR DEVICES;
|
EID: 2342611180
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2004.01.058 Document Type: Article |
Times cited : (11)
|
References (12)
|