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Volumn 74, Issue 2, 2004, Pages 211-216
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Influence of microstructure on the conduction mechanisms in discontinuous metal films on dielectric substrates
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Author keywords
Computer method; Discontinuous metal films; Electrical properties
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Indexed keywords
DIELECTRIC MATERIALS;
ELECTRIC CONDUCTIVITY;
ELECTRIC RESISTANCE;
ELECTRON MICROSCOPY;
ELECTRON TUNNELING;
METALLOGRAPHIC MICROSTRUCTURE;
PERCOLATION (SOLID STATE);
QUANTUM THEORY;
SUBSTRATES;
THERMAL EFFECTS;
TRANSPORT PROPERTIES;
DISCONTINUOUS METAL FILMS;
PERCOLATION THRESHOLD;
QUANTUM TUNNELLING;
THERMALLY ACTIVATED TUNNELLING;
METALLIC FILMS;
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EID: 2342572390
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2003.12.124 Document Type: Conference Paper |
Times cited : (15)
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References (22)
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