Wavelength dependence of liquid-vapor interfacial tension of Ga

Physical Review Letters

Volumn 92, Issue 13, 2004, Pages

  Li, Dongxu ^a   Yang, Bin ^a   Lin, Binhua ^a,b   Meron, Mati ^b   Gebhardt, Jeff ^b   Graber, Tim ^b   Rice, Stuart A ^a  

^a UNIVERSITY OF CHICAGO   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARITY; COMPUTER SIMULATION; FOURIER TRANSFORMS; FREE ENERGY; GALLIUM; HAMILTONIANS; MOLECULAR DYNAMICS; SURFACE TENSION; VAN DER WAALS FORCES; X RAY SCATTERING;

CORRELATION FUNCTIONS; DENSITY FLUCTUATIONS; LIQUID VAPOR INTERFACES; STRATIFICATION;

SURFACE CHEMISTRY;

EID: 2342571476     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.136102     Document Type: Article

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