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Volumn 59, Issue 4, 2004, Pages 585-590

Effect of surfactant addition on ultrasonic leaching of trace elements from plant samples in inductively coupled plasma-atomic emission spectrometry

Author keywords

Electron density; Excitation temperatures; Inductively coupled plasma atomic emission spectrometry; Surfactants; Ultrasonic leaching

Indexed keywords

ATOMIZATION; CARRIER CONCENTRATION; LEACHING; MICELLES; PARAMETER ESTIMATION; SAMPLING; SPECTROMETRY; SURFACE ACTIVE AGENTS; ULTRASONICS;

EID: 2342549271     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.01.013     Document Type: Conference Paper
Times cited : (13)

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