Time dependence of organic polymer thin-film transistors current

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5217, Issue , 2003, Pages 7-15

  Martin, Sandrine ^a,b   Dassas, Laurence ^a   Hamilton, Michael C ^a   Kanicki, Jerzy ^a,c  

^a University of Michigan   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Bias temperature stress; Electrical instabilities; Organic polymers; Thin film transistors; Transient regime

Indexed keywords

BIAS TEMPERATURE STRESS; ELECTRICAL INSTABILITIES; TRANSIENT REGIMES;

CARRIER MOBILITY; CHEMICAL VAPOR DEPOSITION; DEGRADATION; LIGHT EMITTING DIODES; OLIGOMERS; POLARIZATION; SILICON NITRIDE; STRESS ANALYSIS; THIN FILM TRANSISTORS;

ORGANIC POLYMERS;

EID: 2342489364     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.504536     Document Type: Conference Paper

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