Determining the structure of semiconductor heterointerfaces by excitonic optical spectra

Physica Status Solidi C: Conferences

Volumn 1, Issue 3, 2004, Pages 501-505

  Savona, V ^a   Langbein, W ^b   Kocherscheidt, G ^b  

^a EPFL   (Switzerland)

^b TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; EXCITONS; FREQUENCIES; HETEROJUNCTIONS; INTERFACES (MATERIALS); INTERFEROMETRY; MONOLAYERS; QUANTUM THEORY; RAYLEIGH SCATTERING; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SPECKLE; WHITE NOISE;

CENTER-OF-MASS MOTION; QUANTUM MECHANICAL MOTION; RADIATIVE RECOMBINATION; SEMICONDUCTOR HETEROINTERFACES;

SEMICONDUCTOR MATERIALS;

EID: 2342446567     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200304025     Document Type: Conference Paper

References (8)

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