EXAFS study of doped ceria using multiple data set fit

Solid State Ionics

Volumn 176, Issue 23-24, 2005, Pages 1817-1825

  Deguchi, Hiroshi ^a   Yoshida, Hiroyuki ^a   Inagaki, Toru ^a   Horiuchi, Masaki ^b  

^a KANSAI ELECTRIC POWER CO   (Japan)

^b Kanden Power tech Co Ltd   (Japan)

Author keywords

Doped ceria; Ionic conductivity; Local structure; XAFS

Indexed keywords

DOPING (ADDITIVES); GADOLINIUM; IONIC CONDUCTION; LANTHANUM; POSITIVE IONS; SOLID OXIDE FUEL CELLS; X RAY SPECTROSCOPY; YTTRIUM;

DOPANT-RICH CLUSTERS; DOPED CERIA; LCOAL STRUCTURE; XAFS;

CERIUM COMPOUNDS;

EID: 23344454519     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2005.04.043     Document Type: Article

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