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Volumn 54, Issue 4, 2005, Pages 1471-1474

An easy VI program to detect transient disturbances in the supply voltage

Author keywords

Disturbance detection; Virtual instruments; Voltage quality

Indexed keywords

ALGORITHMS; ELECTRIC POWER DISTRIBUTION; ELECTRIC POWER SYSTEMS; ELECTRICITY; INSTRUMENTS;

EID: 23344445175     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.851078     Document Type: Article
Times cited : (19)

References (11)
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  • 3
    • 0003530117 scopus 로고
    • "Electromagnetic compatibility (EMC), Part 3-2, Limits: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <= 16 A"
    • IEC, IEC 61000-3-3
    • "Electromagnetic compatibility (EMC), Part 3-2, Limits: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <= 16 A," IEC, IEC 61000-3-3, 1994.
    • (1994)
  • 4
    • 0003530115 scopus 로고
    • "Electromagnetic compatibility (EMC), Part 3, Limits: Section 5 - Limitation of voltage fluctuations and flicker in low-voltage power supply systems for equipment with rated current greater than 16 A"
    • IEC, IEC 61000-3-5
    • "Electromagnetic compatibility (EMC), Part 3, Limits: Section 5 - Limitation of voltage fluctuations and flicker in low-voltage power supply systems for equipment with rated current greater than 16 A," IEC, IEC 61000-3-5, 1994.
    • (1994)
  • 5
    • 0038169990 scopus 로고    scopus 로고
    • "A low-cost, DSP-based equipment for the detection of transients in power systems"
    • Vail, CO, May 20-22
    • M. Artioli, G. Pasini, L. Peretto, R. Sasdelli, and F. Filippetti, "A low-cost, DSP-based equipment for the detection of transients in power systems," in Proc. IEEE IMTC, Vail, CO, May 20-22, 2003, pp. 252-257.
    • (2003) Proc. IEEE IMTC , pp. 252-257
    • Artioli, M.1    Pasini, G.2    Peretto, L.3    Sasdelli, R.4    Filippetti, F.5
  • 6
    • 0028749580 scopus 로고
    • "An analog method for detecting superimposed power line voltage disturbances"
    • Dec.
    • H. W. Furst, M. Pigl, and J. Baier, "An analog method for detecting superimposed power line voltage disturbances," IEEE Trans. Instrum. Meas., vol. 44, no. 6, pp. 889-893, Dec. 1994.
    • (1994) IEEE Trans. Instrum. Meas. , vol.44 , Issue.6 , pp. 889-893
    • Furst, H.W.1    Pigl, M.2    Baier, J.3
  • 7
    • 0025384384 scopus 로고
    • "A system for capturing and presenting short duration voltage surges on ac power lines"
    • Feb.
    • A. McEachern, "A system for capturing and presenting short duration voltage surges on ac power lines," IEEE Trans. Instrum. Meas., vol. 39, no. 1, pp. 38-41, Feb. 1989.
    • (1989) IEEE Trans. Instrum. Meas. , vol.39 , Issue.1 , pp. 38-41
    • McEachern, A.1
  • 9
    • 0030126570 scopus 로고    scopus 로고
    • "Power quality assessment via wavelet transform analysis"
    • S. Santoso, E. J. Powers, W. M. Grady, and P. Hofmann, "Power quality assessment via wavelet transform analysis," IEEE Trans. Power Del., vol. 11, no. 2, pp. 924-930, 1996.
    • (1996) IEEE Trans. Power Del. , vol.11 , Issue.2 , pp. 924-930
    • Santoso, S.1    Powers, E.J.2    Grady, W.M.3    Hofmann, P.4
  • 10
    • 0037521436 scopus 로고    scopus 로고
    • "A new wavelet transform based procedure for electrical power quality analysis"
    • Las Vegas, NV
    • L. Angrisani, P. Daponte, M. D'Apuzzo, and A. Testa, "A new wavelet transform based procedure for electrical power quality analysis," in Proc. ICHQP, Las Vegas, NV, 1996, pp. 608-614.
    • (1996) Proc. ICHQP , pp. 608-614
    • Angrisani, L.1    Daponte, P.2    D'Apuzzo, M.3    Testa, A.4
  • 11
    • 0036703609 scopus 로고    scopus 로고
    • "A distributed system for electric power quality measurement"
    • Aug.
    • L. Cristaldi, A. Ferrero, and S. Salicone, "A distributed system for electric power quality measurement," IEEE Trans. Instrum. Meas., vol. 51, no. 4, pp. 776-781, Aug. 2002.
    • (2002) IEEE Trans. Instrum. Meas. , vol.51 , Issue.4 , pp. 776-781
    • Cristaldi, L.1    Ferrero, A.2    Salicone, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.