Evaluation of collection substrates for automated single particle analysis of atmospheric particles by SEM-EDS

Journal of Aerosol Science

Volumn 35, Issue SUPPL. 2, 2004, Pages

  Choel M ^a   Deboudt, K ^a   Flament, P ^a   Osan J ^b  

^a Laboratoire d Océanologie et de Géosciences   (France)

^b KFKI ATOMIC ENERGY RESEARCH INSTITUTE   (Hungary)

Author keywords

atmospheric aerosols; CCSEM; chemical composition; Collection substrate

Indexed keywords

AIR MONITORING; AIRBORNE PARTICLE; CHEMICAL COMPOSITION; CONFERENCE PAPER; GEOMETRY; MONTE CARLO METHOD; PARTICLE SIZE; PARTICULATE MATTER; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; X RAY SPECTROMETRY;

EID: 23344438989     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0021-8502(19)30358-1     Document Type: Conference Paper

References (4)

1. Armstrong, J. T., Buseck, P. R. (1985). A general characteristic fluorescence correction for the quantitative electron microbeam analysis of thick specimens, thin films and particles, X-Ray Spectrometry, 14, 172-182.
2. Laskin, A., Cowin, J.P. (2001). Automated single-particle SEM/EDX analysis of submicrometer particles down to 0.1 μm, Analytical Chemistry, 73, 1023-1029.
3. Poelt, P., Schmied, M., Obernberger, I., Brunner, T. (2002). Automated analysis of submicron particles by computer-controlled scanning electron microscopy, Scanning, 24, 92-100.
4. Ro, C.-U., Osán, J., Szalóki, I., de Hoog, J., Worobiec, A., Van Grieken, R. (2003). A Monte Carlo program for quantitative electron-induced X-ray analysis of individual particles, Analytical Chemistry, 75, 851-859.