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Volumn 73, Issue 5, 2001, Pages 1023-1029
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Automated single-particle SEM/EDX analysis of submicrometer particles down to 0.1 μm
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
CARBON;
CHLORIDE;
ELEMENT;
NITROGEN;
OXYGEN;
SILICON;
ACCURACY;
AEROSOL;
ARTICLE;
AUTOANALYSIS;
AUTOMATION;
CHEMICAL ANALYSIS;
CHEMICAL COMPOSITION;
FILTER;
PARTICLE SIZE;
SCANNING ELECTRON MICROSCOPY;
X RAY ANALYSIS;
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EID: 0035282204
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac0009604 Document Type: Article |
Times cited : (92)
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References (28)
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