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Volumn 73, Issue 5, 2001, Pages 1023-1029

Automated single-particle SEM/EDX analysis of submicrometer particles down to 0.1 μm

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CARBON; CHLORIDE; ELEMENT; NITROGEN; OXYGEN; SILICON;

EID: 0035282204     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0009604     Document Type: Article
Times cited : (92)

References (28)
  • 26
    • 0005732760 scopus 로고    scopus 로고
    • Oxford Instruments, Ltd.. Microanalysis group, 45950 Hotchkiss St., Fremont, CA 94539, private communication
    • Betts, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.