A comparison between Engin and Engin-X, a new diffractometer optimized for stress measurement

Physica B: Condensed Matter

Volumn 350, Issue 1-3 SUPPL. 1, 2004, Pages

  Dann, J A ^a   Daymond, M R ^a   Edwards, L ^b   James, J A ^b   Santisteban, J R ^b  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

Author keywords

Engineering; Instrumentation; Materials science; Neutron diffraction; Residual stress; Strain scanning

Indexed keywords

CERAMIC MATERIALS; ENGINEERING; LATTICE CONSTANTS; MATERIALS SCIENCE; NEUTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; STRAIN MEASUREMENT; STRESS ANALYSIS;

INSTRUMENTATION; STRAIN MAPPING; STRAIN SCANNING;

DIFFRACTOMETERS;

EID: 23144451461     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.03.139     Document Type: Conference Paper

References (7)

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4. J.A. Dann, M.R. Daymond, J.A.J. James, J.R. Santisteban, L. Edwards, ENGIN-X: A new diffractometer optimised for stress measurements, in Proc. ICANS XVI, Vol. 1, ISSN 1433-559X, 2003, pp. 231-238.
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