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Volumn 46, Issue 2, 2005, Pages 50-54

The effects of TiO2 on the structure and spectroscopic properties of silica-hafnia based sol-gel waveguides

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; HAFNIUM; QUENCHING; SILICON; SOL-GELS; SPECTROSCOPIC ANALYSIS; WAVEGUIDE COMPONENTS; X RAY DIFFRACTION;

EID: 23144450549     PISSN: 00171050     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (16)
  • 9
    • 0003427458 scopus 로고
    • Addison-Wesley Publishing Company, Inc., Massachusetts
    • Cullity, B. D. Elements of X-Ray Diffraction. Addison-Wesley Publishing Company, Inc., Massachusetts, 1977, p. 102.
    • (1977) Elements of X-ray Diffraction , pp. 102
    • Cullity, B.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.