Controlled ion-beam transformation of electrical, magnetic, and optical materials properties

Physics-Uspekhi

Volumn 44, Issue 1, 2001, Pages 95-105

  Gurovich, B A ^a   Dolgii D I ^a   Kuleshova, E A ^a   Velikhov, E P ^a   Ol'shanskii E D ^a   Domantovskii A G ^a   Aronzon, B A ^a   Meilikhov E Z ^a  

^a KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044528356     PISSN: 10637869     EISSN: None     Source Type: Journal    
DOI: 10.1070/PU2001v044n01ABEH000868     Document Type: Article

References (34)

1. Pchelyakov O P Usp. Fiz. Nauk 170 993 (2000)
2. [Phys. Usp. 43 923 (2000)]
3. Rabalais J W et al. Phys. Rev. B 53 10781 (1996)
4. Haynes T E et al. Appl. Phys. Lett. 54 1439 (1989)
5. Ledentsov N N et al. Usp. Fiz. Nauk 166 423 (1996)
6. [Phys. Usp. 39 393 (1996)]
7. Grundmann M et al. Phys. Rev. Lett. 74 4043 (1995)
8. Tsyrlin G E et al. Fiz. Tekh. Poluprovodn. 33 1083 (1999)
9. [Semicond. 33 677 (1999)]
10. Bimberg D et al. Usp. Fiz. Nauk 167 552 (1997)
11. [Phys. Usp. 40 529 (1997)]
12. Latyshev A V, Aseev A L Usp. Fiz. Nauk 168 1117 (1998)
13. [Phys. Usp. 41 1015 (1998)]
14. Bogomolov V N et al. Fiz. Tverd. Tela 43 (2) 357 (2001)
15. [Phys. Solid State 43 373 (2001)]; Patent Ross. Fed. 2153208 (1999)
16. Landau L D, Lifshitz E M Mekhanika (Mechanics) (Moscow: Nauka, 1973) [Translated into English (Oxford: Pergamon Press, 1976)]
17. Thompson M W Defects and Radiation Damage in Metals (London: Cambridge Univ. Press, 1969)
18. Klinger M I et al. Usp. Fiz. Nauk 147 523 (1985)
19. [Sov. Phys. Usp. 28 994 (1985)]
20. Handbook of Thin Film Technology (Eds L I Maissel, R Glang) (New York: McGraw-Hill, 1970)
21. Hirsch P B et al. Electron Microscopy of Thin Crystals (London: Butterworths, 1965) [Translated into Russian (Moscow: Mir, 1968)]
22. Wiesendanger R, Güntherodt H-J (Eds) Scanning Tunneling Microscopy II: Further Applications and Related Scanning Techniques (Springer Series in Surface Sciences, 28) (Berlin: Springer-Verlag, 1992)
23. Practical Surface Analysis: by Auger and X-ray Photoelectron Spectroscopy (Eds D Briggs, M P Seah) (New York: Wiley, 1983)
24. Chopra K L, Randlett M R, Duff R N Philos. Mag. 16 261 (1967)
25. Chopra K L, Randlett M R, Duff R N Appl. Phys. Lett. 9 402 (1966)
26. Cahn RW Contemp. Phys. 21 43 (1980)
27. Abrikosov A A Fundamentals of the Theory of Metals (Amsterdam: North-Holland, 1988)
28. Altshuler B L, Aronov A G, in Electron-Electron Interactions in Disordered Systems (Modern Problems in Condensed Matter Sciences, Vol. 10, Eds A L Efros, M Pollak) (Amsterdam: North-Holland, 1985)
29. Annenkov Yu M et al. Fiz. Khim. Obrabotki Materialov (5) 5 (1999)
30. Pichugin V F et al. Nucl. Instrum. Meth. B 80/81 1203 (1993)
31. Annenkov Yu M et al. Fiz. Khim. Obrabotki Materialov (6) 9 (1994)
32. Zavodchikov V N et al. Pis'ma Zh. Tekh. Fiz. 22 7 (1996)
33. Physical Metallurgy (Eds R W Cahn, P Haasen) 3rd ed. (Amsterdam: North-Holland, 1983)
34. Valiev K A Fizika Submikronnoǐ Litografii (The Physics of Submicron Lithography) (Moscow: Nauka, 1990) [Translated into English (New York: Plenum Press, 1992)]