Structure-property relations in Au55 cluster layers studied by temperature-dependent impedance measurements

ChemPhysChem

Volumn 2, Issue 5, 2001, Pages 321-325

  Torma, Viktoria ^a   Schmid, Günter ^a,b   Simon, Ulrich ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Cluster compound; Conducting mechanisms; Impedance; Thin films

Indexed keywords

THIN FILMS;

CLUSTER COMPOUNDS; CONDUCTING MECHANISM; IMPEDANCE MEASUREMENT; STRUCTURE PROPERTY RELATION; TEMPERATURE DEPENDENT;

ELECTRIC IMPEDANCE;

EID: 23044526226     PISSN: 14394235     EISSN: None     Source Type: Journal    
DOI: 10.1002/1439-7641(20010518)2:5<321::AID-CPHC321>3.0.CO;2-4     Document Type: Article

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