Dimer structure of the Si(0 0 1)2 × 1 surface observed by low-temperature scanning tunneling microscope

Physica B: Condensed Matter

Volumn 329-333, Issue II, 2003, Pages 1644-1646

  Ono, Masanori ^a   Kamoshida, A ^a   Matsuura, N ^a   Eguchi, T ^a   Hasegawa, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Scanning tunneling microscopy; Si(0 0 1)2 1; Silicon dimer structure; Silicon surface

Indexed keywords

DIMERS; LOW TEMPERATURE EFFECTS; MAGNETIC FIELDS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

ASYMMETRIC DIMERS; SILICON DIMER STRUCTURE; SILICON SURFACE; ULTRAHIGH VACCUM (UHV);

SILICON;

EID: 23044514413     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(02)02439-0     Document Type: Conference Paper

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