In situ synchrotron-radiation angle-resolved photoemission study on la 0.6Sr0.4MnO3 thin films grown by laser molecular beam epitaxy

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue I, 2004, Pages 434-435

  Kumigashira, H ^a   Horiba, K ^a   Ohguchi, H ^a   Oshima, M ^a   Nakagawa, N ^a   Lippmaa, M ^a   Ono, K ^b   Kawasaki, M ^c   Koinuma, H ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Angle resolved photoemission spectroscopy; Band structure; La0.6Sr0.4MnO3 thin film; Laser MBE

Indexed keywords

ATOMIC FORCE MICROSCOPY; BAND STRUCTURE; LANTHANUM COMPOUNDS; LASERS; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; PHOTOEMISSION; SUPERCONDUCTING MATERIALS; SYNCHROTRON RADIATION;

ANGLE-RESOLVED PHOTOEMISSION SPECTROSCOPY (ARPES); LA0.6SR0.4MNO3 THIN FILMS; LASER MOLECULAR BEAM EPITAXY (LASER MBE); METAL OXIDE THIN FILMS;

THIN FILMS;

EID: 23044503940     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2003.12.1255     Document Type: Conference Paper

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