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Volumn 3, Issue 7, 2005, Pages 425-427
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Investigation of ultra-short-period W/C multilayers for soft X-ray optics
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Author keywords
[No Author keywords available]
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Indexed keywords
MAGNETRON SPUTTERING;
OPTICAL FILMS;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
X RAY OPTICS;
PERIODIC THICKNESS;
ULTRA-SHORT-PERIOD W/C MULTILAYERS;
MULTILAYERS;
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EID: 23044478412
PISSN: 16717694
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (5)
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References (15)
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