Convective assembly of antireflective silica coatings with controlled thickness and refractive index

Chemistry of Materials

Volumn 17, Issue 14, 2005, Pages 3642-3651

  Prevo, Brian G ^a   Hwang, Yeon ^b   Velev, Orlin D ^a  

^a North Carolina State University   (United States)

^b Seoul National University of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FILM STRUCTURE; NANOPARTICLES; PACKING FRACTION; SILICA COATINGS;

COATINGS; DEPOSITION; ELLIPSOMETRY; LIGHT REFLECTION; LIGHT TRANSMISSION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTIMIZATION; REFRACTIVE INDEX; THICKNESS MEASUREMENT; THIN FILMS; VOLUME FRACTION;

SILICA;

EID: 22944488858     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm050416h     Document Type: Article

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